Grace Hopper Distinguished Lecture Series Presents:

Elaine J.Weyuker

AT&T Labs–Research

Shannon Laboratory

"Bugs - Find Them Before They Find You!"

Abtract:

It would obviously be very valuable to know in advance which files in the next release of a large software system are most likely to contain the largest numbers of defects. To accomplish this, we developed a negative binomial regression model and used it to predict the expected number of defects in each file of the next release of a system. The predictions are based on code characteristics and fault and modification history data. We will discuss what we have learned from applying the model to several large industrial systems, each with multiple years of field exposure, and tell you about our success in making accurate predictions and some of the lessons learned and issues  that had to be dealt with.

 

Tuesday, November 17, 2009
3:00 - 4:15
Wu & Chen
101 Levine Hall